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【英文标准名称】:Electricalequipmentformeasurement,controlandlaboratoryuse-EMCrequirements-Part3-1:Immunityrequirementsforsafety-relatedsystemsandforequipmentintendedtoperformsafety-relatedfunctions(functionalsafety)-Generalindustri
【原文标准名称】:测量、控制和实验室用电气设备.电磁兼容性(EMC)的要求.与安全相关的系统和用于与执行安全相关功能(功能安全)的设备用抗扰度要求.一般工业设施
【标准号】:BSEN61326-3-1-2008
【标准状态】:现行
【国别】:英国
【发布日期】:2009-01-31
【实施或试行日期】:2009-01-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:控制图;控制工艺学;定义;电控制设备;电气工程;电气设备;电驱动装置;电磁兼容性;EMC;特点;功能效率;功能可靠性;功能;抗扰度;工业设施;工业;干扰抑制;干扰辐射;极限(数学);场所;测量仪器;使用条件;过程测量和控制设备;过程测量和控制技术;辐射;安全;规范(验收);样品;电源电压;试验设备;试验;试验准备工作
【英文主题词】:Controlcharts;Controltechnology;Definition;Definitions;Electriccontrolequipment;Electricalengineering;Electricalequipment;Electrically-operateddevices;Electromagneticcompatibility;EMC;Features;Functionalefficiency;Functionalreliability;Functions;Immunity;Industrialfacilities;Industries;Interferencerejections;Interferingemissions;Limits(mathematics);Locations;Measuringinstruments;Operatingconditions;Processmeasuringandcontrolequipment;Processmeasuringandcontroltechnology;Radiation;Safety;Specification(approval);Specimens;Supplyvoltages;Testequipment;Testing;Testingset-ups
【摘要】:ThescopeofIEC61326-1appliestothispartofIEC61326butislimitedtosystemsandequipmentforindustrialapplicationsintendedtoperformsafetyfunctionsasdefinedinIEC61508withSIL1-3.Theelectromagneticenvironmentsencompassedbythisproductfamilystandardareindustrial,bothindoorandoutdoor,asdescribedforindustriallocationsinIEC61000-6-2ordefinedin3.7ofIEC61326-1.Equipmentandsystemsintendedforuseinotherelectromagneticenvironments,forexample,intheprocessindustryorinenvironmentswithpotentiallyexplosiveatmospheres,areexcludedfromthescopeofthisproductfamilystandard,IEC61326-3-1.Equipmentandsystemsconsideredas“proven-in-use”accordingtoIEC61508orIEC61511areexcludedfromthescopeofIEC61326-3-1.FirealarmsystemsandsecurityalarmsystemsintendedforprotectionofbuildingsareexcludedfromthescopeofIEC61326-3-1.
【中国标准分类号】:K60;L06
【国际标准分类号】:25_040_40;33_100_20
【页数】:48P.;A4
【正文语种】:英语


【英文标准名称】:Microwavediodesandtransistors-Microwavefieldeffecttransistors-Blankdetailspecification-BDSformicrowavefield-effecttransistors
【原文标准名称】:微波二极管和晶体管.微波场效应晶体管.空白详细规范
【标准号】:BSIEC60747-4-1-2000
【标准状态】:作废
【国别】:英国
【发布日期】:2000-09-15
【实施或试行日期】:2000-09-15
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:晶体管;二极管;分立式;微波晶体管;电子设备及元件;半导体器件
【英文主题词】:Diodes;Discrete;Electronicequipmentandcomponents;Microwavetransistors;Semiconductordevices;Transistors
【摘要】:Semiconductordevices—Discretedevices—Part4-1:Microwavediodesandtransistors—Microwavefieldeffecttransistors—Blankdetailspecification1Mechanicaldescription2Shortdescription3Categoriesofassessedquality4Limitingvalues(absolutemaximumratingsystem)commontoallapplications5Electricalcharacteristics6Marking7Orderinginformation8Testconditionsandinspectionrequirements
【中国标准分类号】:L44
【国际标准分类号】:31_080_30
【页数】:20P;A4
【正文语种】:英语